One-Day Workshop on Materials Characterisation Tools (XRD & SEM) and Simulation Through DFT Held at MGIT

News Date : 29 Aug 2026     News Report

Date: 29 August 2026

The Department of Physics and Chemistry, Mahatma Gandhi Institute of Technology (MGIT), Gandipet, in collaboration with the Telangana Academy of Sciences (TAS), organised a One-Day Workshop on “Materials Characterisation Tools (XRD & SEM) and Simulation Through DFT” on 29 August 2026.

The workshop brought together faculty members, researchers, scientists, and students with the objective of enhancing their understanding of advanced materials characterisation techniques and their applications in scientific research.

Addressing the gathering, Prof. K. Sudhakar Reddy, Vice-Principal, MGIT, highlighted the importance of such workshops in providing participants with real-time exposure and practical insights into research. He noted that X-Ray Diffraction (XRD) is particularly useful for students and faculty members engaged in simulation and research-related studies.

Prof. B. N. Reddy, Zonal In-Charge, Telangana Academy of Sciences (TAS), stated that TAS is committed to promoting technological advancement. He emphasised the importance of continuously updating knowledge and skills in emerging technologies in the rapidly evolving technological environment.

Prof. S. Satyanarayana, Secretary, Telangana Academy of Sciences (TAS), and Chief Guest of the workshop, stressed that the roots of fundamental research lie at the institutional level. He encouraged faculty members to actively pursue research within their institutions while continuing to contribute at the national level.

The workshop was conducted in hybrid mode, with around 100 participants joining online and approximately 60 participants attending in person.

During the technical sessions, Dr. Ashish Pathak, Scientist, DMRL, Hyderabad, delivered a lecture on Density Functional Theory (DFT) and its applications in various fields. Dr. K. Suresh, Scientist, ARCI, Hyderabad, delivered a session on Rietveld Refinement using XRD.

In his inaugural address, Prof. A. K. Singh, Chairperson of the workshop, highlighted the importance of materials and their characterisation from a multidisciplinary perspective. He emphasised that a comprehensive understanding of materials characterisation techniques is essential for advancing research across scientific and technological disciplines.

At the conclusion of the workshop, certificates were distributed to the participants. Dr. B. Venugopal Rao, Head, Department of Physics and Chemistry, proposed the vote of thanks and expressed gratitude to the resource persons, dignitaries, participants, and organisers for contributing to the successful conduct of the workshop.

Faculty and staff of MGIT, along with delegates from various institutions, participated in the programme. The workshop provided an excellent platform for participants to gain and share knowledge in the field of materials characterisation techniques.

Outcomes Achieved

The workshop highlighted the importance of materials and their characterisation from a multidisciplinary perspective. Participants gained exposure to advanced techniques such as X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Density Functional Theory (DFT), and Rietveld Refinement, strengthening their understanding of their applications in research.

Outcome

• To provide practical exposure to advanced concepts in solid-state and modern physics.